Mapping statistical process variations toward circuit performance variability: an analytical modeling approach - researchr publication authors

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Yu Cao, Lawrence T. Clark. Mapping statistical process variations toward circuit performance variability: an analytical modeling approach. In William H. Joyner Jr., Grant Martin, Andrew B. Kahng, editors, Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005. pages 658-663, ACM, 2005. [doi]

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