Yu Cao, Lawrence T. Clark. Mapping statistical process variations toward circuit performance variability: an analytical modeling approach. In William H. Joyner Jr., Grant Martin, Andrew B. Kahng, editors, Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005. pages 658-663, ACM, 2005. [doi]
@inproceedings{CaoC05:0,
title = {Mapping statistical process variations toward circuit performance variability: an analytical modeling approach},
author = {Yu Cao and Lawrence T. Clark},
year = {2005},
doi = {10.1145/1065579.1065752},
url = {http://doi.acm.org/10.1145/1065579.1065752},
tags = {modeling, process modeling, systematic-approach},
researchr = {https://researchr.org/publication/CaoC05%3A0},
cites = {0},
citedby = {0},
pages = {658-663},
booktitle = {Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005},
editor = {William H. Joyner Jr. and Grant Martin and Andrew B. Kahng},
publisher = {ACM},
isbn = {1-59593-058-2},
}