Yu Cao, Lawrence T. Clark. Mapping statistical process variations toward circuit performance variability: an analytical modeling approach. In William H. Joyner Jr., Grant Martin, Andrew B. Kahng, editors, Proceedings of the 42nd Design Automation Conference, DAC 2005, San Diego, CA, USA, June 13-17, 2005. pages 658-663, ACM, 2005. [doi]
Abstract is missing.