Mapping Statistical Process Variations Toward Circuit Performance Variability: An Analytical Modeling Approach

Yu Cao, Lawrence T. Clark. Mapping Statistical Process Variations Toward Circuit Performance Variability: An Analytical Modeling Approach. IEEE Trans. on CAD of Integrated Circuits and Systems, 26(10):1866-1873, 2007. [doi]

Authors

Yu Cao

This author has not been identified. Look up 'Yu Cao' in Google

Lawrence T. Clark

This author has not been identified. Look up 'Lawrence T. Clark' in Google