Yu Cao, Lawrence T. Clark. Mapping Statistical Process Variations Toward Circuit Performance Variability: An Analytical Modeling Approach. IEEE Trans. on CAD of Integrated Circuits and Systems, 26(10):1866-1873, 2007. [doi]
@article{CaoC07:1,
title = {Mapping Statistical Process Variations Toward Circuit Performance Variability: An Analytical Modeling Approach},
author = {Yu Cao and Lawrence T. Clark},
year = {2007},
doi = {10.1109/TCAD.2007.895613},
url = {http://dx.doi.org/10.1109/TCAD.2007.895613},
tags = {modeling, process modeling, systematic-approach},
researchr = {https://researchr.org/publication/CaoC07%3A1},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {26},
number = {10},
pages = {1866-1873},
}