Yu Cao, Colin C. McAndrew. MOSFET modeling for 45nm and beyond. In Georges G. E. Gielen, editor, 2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA. pages 638-643, IEEE, 2007. [doi]
@inproceedings{CaoM07,
title = {MOSFET modeling for 45nm and beyond},
author = {Yu Cao and Colin C. McAndrew},
year = {2007},
doi = {10.1145/1326073.1326207},
url = {http://doi.acm.org/10.1145/1326073.1326207},
tags = {meta-model, modeling, C++, Meta-Environment},
researchr = {https://researchr.org/publication/CaoM07},
cites = {0},
citedby = {0},
pages = {638-643},
booktitle = {2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA},
editor = {Georges G. E. Gielen},
publisher = {IEEE},
isbn = {1-4244-1382-6},
}