Yu Cao, Jyothi Velamala, Ketul Sutaria, Mike Shuo-Wei Chen, Jonathan Ahlbin, Ivan Sanchez Esqueda, Michael Bajura, Michael Fritze. Cross-Layer Modeling and Simulation of Circuit Reliability. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(1):8-23, 2014. [doi]
Abstract is missing.