Xuebing Cao, Liyi Xiao, Jie Li, Rongsheng Zhang, Shanshan Liu, Jinxiang Wang. A Layout-Based Soft Error Vulnerability Estimation Approach for Combinational Circuits Considering Single Event Multiple Transients (SEMTs). IEEE Trans. on CAD of Integrated Circuits and Systems, 38(6):1109-1122, 2019. [doi]
@article{CaoXLZLW19,
title = {A Layout-Based Soft Error Vulnerability Estimation Approach for Combinational Circuits Considering Single Event Multiple Transients (SEMTs)},
author = {Xuebing Cao and Liyi Xiao and Jie Li and Rongsheng Zhang and Shanshan Liu and Jinxiang Wang},
year = {2019},
doi = {10.1109/TCAD.2018.2834425},
url = {https://doi.org/10.1109/TCAD.2018.2834425},
researchr = {https://researchr.org/publication/CaoXLZLW19},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {38},
number = {6},
pages = {1109-1122},
}