Xuebing Cao, Liyi Xiao, Jie Li, Rongsheng Zhang, Shanshan Liu, Jinxiang Wang. A Layout-Based Soft Error Vulnerability Estimation Approach for Combinational Circuits Considering Single Event Multiple Transients (SEMTs). IEEE Trans. on CAD of Integrated Circuits and Systems, 38(6):1109-1122, 2019. [doi]
Abstract is missing.