A Low Power Deterministic Test Pattern Generator for BIST Based on Cellular Automata - researchr publication authors

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Bei Cao, Liyi Xiao, Yong-sheng Wang. A Low Power Deterministic Test Pattern Generator for BIST Based on Cellular Automata. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 266-269, IEEE Computer Society, 2008. [doi]

This author has not been identified. Look up 'Bei Cao' in GoogleThis author has not been identified. Look up 'Liyi Xiao' in GoogleThis author has not been identified. Look up 'Yong-sheng Wang' in Google

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