Bei Cao, Liyi Xiao, Yong-sheng Wang. A Low Power Deterministic Test Pattern Generator for BIST Based on Cellular Automata. In 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008. pages 266-269, IEEE Computer Society, 2008. [doi]
@inproceedings{CaoXW08,
title = {A Low Power Deterministic Test Pattern Generator for BIST Based on Cellular Automata},
author = {Bei Cao and Liyi Xiao and Yong-sheng Wang},
year = {2008},
doi = {10.1109/DELTA.2008.65},
url = {http://doi.ieeecomputersociety.org/10.1109/DELTA.2008.65},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/CaoXW08},
cites = {0},
citedby = {0},
pages = {266-269},
booktitle = {4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008, Hong Kong, January 23-25, 2008},
publisher = {IEEE Computer Society},
}