The Use of Linear Models for the Efficient and Accurate Testing of A/D Converters - researchr publication authors

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Peter D. Capofreddi, Bruce A. Wooley. The Use of Linear Models for the Efficient and Accurate Testing of A/D Converters. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 54-60, IEEE Computer Society, 1995.

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