Peter D. Capofreddi, Bruce A. Wooley. The Use of Linear Models for the Efficient and Accurate Testing of A/D Converters. In Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995. pages 54-60, IEEE Computer Society, 1995.
@inproceedings{CapofreddiW95,
title = {The Use of Linear Models for the Efficient and Accurate Testing of A/D Converters},
author = {Peter D. Capofreddi and Bruce A. Wooley},
year = {1995},
tags = {testing},
researchr = {https://researchr.org/publication/CapofreddiW95},
cites = {0},
citedby = {0},
pages = {54-60},
booktitle = {Proceedings IEEE International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995},
publisher = {IEEE Computer Society},
isbn = {0-7803-2992-9},
}