Marcelo A. Cappelletti, Ariel P. Cédola, S. Baron, G. Casas, Eitel L. Peltzer y Blancá. Study of radiation effects on PIN photodiodes with deep-trap levels using computer modeling. In 10th Latin American Test Workshop, LATW 2009, Rio de Janeiro, Brazil, March 2-5, 2009. pages 1-6, IEEE, 2009. [doi]
Abstract is missing.