Structural constraints for circular self-test paths

Joan Carletta, Christos A. Papachristou. Structural constraints for circular self-test paths. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 486-491, IEEE Computer Society, 1995. [doi]

Authors

Joan Carletta

This author has not been identified. Look up 'Joan Carletta' in Google

Christos A. Papachristou

This author has not been identified. Look up 'Christos A. Papachristou' in Google