Joan Carletta, Christos A. Papachristou. Structural constraints for circular self-test paths. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 486-491, IEEE Computer Society, 1995. [doi]
@inproceedings{CarlettaP94,
title = {Structural constraints for circular self-test paths},
author = {Joan Carletta and Christos A. Papachristou},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000486abs.htm},
tags = {testing, constraints},
researchr = {https://researchr.org/publication/CarlettaP94},
cites = {0},
citedby = {0},
pages = {486-491},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}