Stefano Di Carlo, Marco Indaco, Paolo Prinetto, Elena I. Vatajelu, Rosa Rodríguez-Montañés, Joan Figueras. Reliability estimation at block-level granularity of spin-transfer-torque MRAMs. In 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014, Amsterdam, The Netherlands, October 1-3, 2014. pages 75-80, IEEE, 2014. [doi]
Abstract is missing.