Stefano Di Carlo, Alessandro Savino, Alberto Scionti, Paolo Prinetto. Influence of Parasitic Capacitance Variations on 65 nm and 32 nm Predictive Technology Model SRAM Core-Cells. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 411-416, IEEE Computer Society, 2008. [doi]
@inproceedings{CarloSSP08,
title = {Influence of Parasitic Capacitance Variations on 65 nm and 32 nm Predictive Technology Model SRAM Core-Cells},
author = {Stefano Di Carlo and Alessandro Savino and Alberto Scionti and Paolo Prinetto},
year = {2008},
doi = {10.1109/ATS.2008.13},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2008.13},
researchr = {https://researchr.org/publication/CarloSSP08},
cites = {0},
citedby = {0},
pages = {411-416},
booktitle = {17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3396-4},
}