Stefano Di Carlo, Alessandro Savino, Alberto Scionti, Paolo Prinetto. Influence of Parasitic Capacitance Variations on 65 nm and 32 nm Predictive Technology Model SRAM Core-Cells. In 17th IEEE Asian Test Symposium, ATS 2008, Sapporo, Japan, November 24-27, 2008. pages 411-416, IEEE Computer Society, 2008. [doi]
Abstract is missing.