An ROBDD-Based Combinatorial Method for the Evaluation of Yield of Defect-Tolerant Systems-on-Chip

Juan A. Carrasco, Víctor Suñé. An ROBDD-Based Combinatorial Method for the Evaluation of Yield of Defect-Tolerant Systems-on-Chip. IEEE Trans. VLSI Syst., 17(2):207-220, 2009. [doi]

Abstract

Abstract is missing.