Mauricio de Carvalho, Paolo Bernardi, Ernesto Sánchez, Matteo Sonza Reorda. An Enhanced Strategy for Functional Stress Pattern Generation for System-on-Chip Reliability Characterization. In Magdy S. Abadir, Jay Bhadra, Li-C. Wang, editors, 11th International Workshop on Microprocessor Test and Verification, MTV 2010, Austin, TX, USA, December 13-15, 2010. pages 29-34, IEEE, 2010. [doi]
Abstract is missing.