March SR3C: A Test for a reduced model of all static simple three-cell coupling faults in random-access memories

Petru Cascaval, Doina Cascaval. March SR3C: A Test for a reduced model of all static simple three-cell coupling faults in random-access memories. Microelectronics Journal, 41(4):212-218, 2010. [doi]

Abstract

Abstract is missing.