Karine Castellani-Coulié, Jean Michel Portal, Gilles Micolau, Hassen Aziza. Analysis of SEU parameters for the study of SRAM cells reliability under radiation. In 12th Latin American Test Workshop, LATW 2011, Beach of Porto de Galinhas, Brazil, March 27-30, 2011. pages 1-5, IEEE, 2011. [doi]
Abstract is missing.