SiC power MOSFETs performance, robustness and technology maturity

Alberto Castellazzi, Asad Fayyaz, G. Romano, Li Yang, Michele Riccio, Andrea Irace. SiC power MOSFETs performance, robustness and technology maturity. Microelectronics Reliability, 58:164-176, 2016. [doi]

Abstract

Abstract is missing.