Alberto Castellazzi, Asad Fayyaz, Siwei Zhu, Thorsten Oeder, Martin Pfost. Single pulse short-circuit robustness and repetitive stress aging of GaN GITs. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 4, IEEE, 2018. [doi]
@inproceedings{CastellazziFZOP18,
title = {Single pulse short-circuit robustness and repetitive stress aging of GaN GITs},
author = {Alberto Castellazzi and Asad Fayyaz and Siwei Zhu and Thorsten Oeder and Martin Pfost},
year = {2018},
doi = {10.1109/IRPS.2018.8353593},
url = {https://doi.org/10.1109/IRPS.2018.8353593},
researchr = {https://researchr.org/publication/CastellazziFZOP18},
cites = {0},
citedby = {0},
pages = {4},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5479-8},
}