Single pulse short-circuit robustness and repetitive stress aging of GaN GITs

Alberto Castellazzi, Asad Fayyaz, Siwei Zhu, Thorsten Oeder, Martin Pfost. Single pulse short-circuit robustness and repetitive stress aging of GaN GITs. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 4, IEEE, 2018. [doi]

Abstract

Abstract is missing.