Trace-based KPN composability analysis for mapping simultaneous applications to MPSoC platforms

Jerónimo Castrillón, Ricardo Velasquez, Anastasia Stulova, Weihua Sheng, Jianjiang Ceng, Rainer Leupers, Gerd Ascheid, Heinrich Meyr. Trace-based KPN composability analysis for mapping simultaneous applications to MPSoC platforms. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 753-758, IEEE, 2010. [doi]

Authors

Jerónimo Castrillón

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Ricardo Velasquez

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Anastasia Stulova

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Weihua Sheng

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Jianjiang Ceng

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Rainer Leupers

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Gerd Ascheid

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Heinrich Meyr

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