Jerónimo Castrillón, Ricardo Velasquez, Anastasia Stulova, Weihua Sheng, Jianjiang Ceng, Rainer Leupers, Gerd Ascheid, Heinrich Meyr. Trace-based KPN composability analysis for mapping simultaneous applications to MPSoC platforms. In Design, Automation and Test in Europe, DATE 2010, Dresden, Germany, March 8-12, 2010. pages 753-758, IEEE, 2010. [doi]
Abstract is missing.