Individual Signal Path Calibration for Maximum Timing Accuracy in a High Pincount VLSI Test System - researchr publication

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Michael Catalano, Richard K. Feldman, Roberto Krutiansky, Richard Swan. Individual Signal Path Calibration for Maximum Timing Accuracy in a High Pincount VLSI Test System. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 188-192, IEEE Computer Society, 1983.

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