First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics - researchr publication authors

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Carlo Cazzaniga, Marta Bagatin, Simone Gerardin, Alessandra Costantino, Christopher D. Frost. First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics. IEEE Trans. Emerging Topics Comput., 9(1):104-108, 2021. [doi]

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