First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics

Carlo Cazzaniga, Marta Bagatin, Simone Gerardin, Alessandra Costantino, Christopher D. Frost. First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics. IEEE Trans. Emerging Topics Comput., 9(1):104-108, 2021. [doi]

@article{CazzanigaBGCF21,
  title = {First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics},
  author = {Carlo Cazzaniga and Marta Bagatin and Simone Gerardin and Alessandra Costantino and Christopher D. Frost},
  year = {2021},
  doi = {10.1109/TETC.2018.2879027},
  url = {https://doi.org/10.1109/TETC.2018.2879027},
  researchr = {https://researchr.org/publication/CazzanigaBGCF21},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. Emerging Topics Comput.},
  volume = {9},
  number = {1},
  pages = {104-108},
}