Carlo Cazzaniga, Marta Bagatin, Simone Gerardin, Alessandra Costantino, Christopher D. Frost. First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics. IEEE Trans. Emerging Topics Comput., 9(1):104-108, 2021. [doi]
Abstract is missing.