A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis

L. Ceccarelli, Paula Diaz Reigosa, Francesco Iannuzzo, Frede Blaabjerg. A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis. Microelectronics Reliability, 76:272-276, 2017. [doi]

Abstract

Abstract is missing.