Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet. LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis. Microelectronics Reliability, 51(9-11):1662-1667, 2011. [doi]
@article{CeliDPPRLV11,
title = {LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis},
author = {Guillaume Celi and Sylvain Dudit and Thierry Parrassin and Philippe Perdu and Antoine Reverdy and Dean Lewis and Michel Vallet},
year = {2011},
doi = {10.1016/j.microrel.2011.07.030},
url = {http://dx.doi.org/10.1016/j.microrel.2011.07.030},
researchr = {https://researchr.org/publication/CeliDPPRLV11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {9-11},
pages = {1662-1667},
}