Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet. Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below). Microelectronics Reliability, 50(9-11):1499-1505, 2010. [doi]
@article{CeliDPRPBLV10,
title = {Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below)},
author = {Guillaume Celi and Sylvain Dudit and Philippe Perdu and Antoine Reverdy and Thierry Parrassin and Emmanuel Bechet and Dean Lewis and Michel Vallet},
year = {2010},
doi = {10.1016/j.microrel.2010.07.115},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.115},
researchr = {https://researchr.org/publication/CeliDPRPBLV10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1499-1505},
}