Jae Chul Cha, Sandeep K. Gupta. Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 126-135, IEEE Computer Society, 2011. [doi]
@inproceedings{ChaG11,
title = {Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates},
author = {Jae Chul Cha and Sandeep K. Gupta},
year = {2011},
doi = {10.1109/ATS.2011.71},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2011.71},
researchr = {https://researchr.org/publication/ChaG11},
cites = {0},
citedby = {0},
pages = {126-135},
booktitle = {Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011},
publisher = {IEEE Computer Society},
isbn = {978-1-4577-1984-4},
}