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Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates

Jae Chul Cha, Sandeep K. Gupta. Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 126-135, IEEE Computer Society, 2011. [doi]

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