Asma Chabane, Mridula Prathapan, Peter Mueller, Eunjung Cha, Pier Andrea Francese, Marcel A. Kossel, Thomas Morf, Cezar B. Zota. Cryogenic Characterization and Modeling of 14 nm Bulk FinFET Technology. In 51st IEEE European Solid-State Device Research Conference, ESSDERC 2021, Grenoble, France, September 13-22, 2021. pages 67-70, IEEE, 2021. [doi]
Abstract is missing.