Low-power design under variation using error prevention and error tolerance (invited paper)

Kwanyeob Chae, Minki Cho, Saibal Mukhopadhyay. Low-power design under variation using error prevention and error tolerance (invited paper). In 13th Latin American Test Workshop, LATW 2012, Quito, Ecuador, April 10-13, 2012. pages 1-6, IEEE Computer Society, 2012. [doi]

@inproceedings{ChaeCM12,
  title = {Low-power design under variation using error prevention and error tolerance (invited paper)},
  author = {Kwanyeob Chae and Minki Cho and Saibal Mukhopadhyay},
  year = {2012},
  doi = {10.1109/LATW.2012.6261232},
  url = {http://doi.ieeecomputersociety.org/10.1109/LATW.2012.6261232},
  researchr = {https://researchr.org/publication/ChaeCM12},
  cites = {0},
  citedby = {0},
  pages = {1-6},
  booktitle = {13th Latin American Test Workshop, LATW 2012, Quito, Ecuador, April 10-13, 2012},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4673-2355-0},
}