Error resilient logic circuits under dynamic variations

Kwanyeob Chae, Saibal Mukhopadhyay. Error resilient logic circuits under dynamic variations. In 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013. pages 250, IEEE, 2013. [doi]

Authors

Kwanyeob Chae

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Saibal Mukhopadhyay

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