Kwanyeob Chae, Saibal Mukhopadhyay. Error resilient logic circuits under dynamic variations. In 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013. pages 250, IEEE, 2013. [doi]
@inproceedings{ChaeM13,
title = {Error resilient logic circuits under dynamic variations},
author = {Kwanyeob Chae and Saibal Mukhopadhyay},
year = {2013},
doi = {10.1109/IOLTS.2013.6604094},
url = {http://dx.doi.org/10.1109/IOLTS.2013.6604094},
researchr = {https://researchr.org/publication/ChaeM13},
cites = {0},
citedby = {0},
pages = {250},
booktitle = {2013 IEEE 19th International On-Line Testing Symposium (IOLTS), Chania, Crete, Greece, July 8-10, 2013},
publisher = {IEEE},
}