X-value elimination by scan slice correlation analysis

Hyunsu Chae, Joon-Sung Yang. X-value elimination by scan slice correlation analysis. In Proceedings of the 55th Annual Design Automation Conference, DAC 2018, San Francisco, CA, USA, June 24-29, 2018. ACM, 2018. [doi]

Authors

Hyunsu Chae

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Joon-Sung Yang

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