Hyunsu Chae, Joon-Sung Yang. X-value elimination by scan slice correlation analysis. In Proceedings of the 55th Annual Design Automation Conference, DAC 2018, San Francisco, CA, USA, June 24-29, 2018. ACM, 2018. [doi]
@inproceedings{ChaeY18, title = {X-value elimination by scan slice correlation analysis}, author = {Hyunsu Chae and Joon-Sung Yang}, year = {2018}, doi = {10.1145/3195970.3196127}, url = {http://doi.acm.org/10.1145/3195970.3196127}, researchr = {https://researchr.org/publication/ChaeY18}, cites = {0}, citedby = {0}, booktitle = {Proceedings of the 55th Annual Design Automation Conference, DAC 2018, San Francisco, CA, USA, June 24-29, 2018}, publisher = {ACM}, }