Shravan K. Chaganti, Li Xu, Degang Chen. A low-cost method for separation and accurate estimation of ADC noise, aperture jitter, and clock jitter. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.