An Efficient Test Generation Technique for Sequential Circuits with Repetitive Sub-Circuits - researchr publication authors

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Dhruva R. Chakrabarti, Ajai Jain. An Efficient Test Generation Technique for Sequential Circuits with Repetitive Sub-Circuits. In 9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India. pages 174-177, IEEE Computer Society, 1996. [doi]

This author has not been identified. Look up 'Dhruva R. Chakrabarti' in GoogleThis author has not been identified. Look up 'Ajai Jain' in Google

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