Dhruva R. Chakrabarti, Ajai Jain. An Efficient Test Generation Technique for Sequential Circuits with Repetitive Sub-Circuits. In 9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India. pages 174-177, IEEE Computer Society, 1996. [doi]
@inproceedings{ChakrabartiJ96,
title = {An Efficient Test Generation Technique for Sequential Circuits with Repetitive Sub-Circuits},
author = {Dhruva R. Chakrabarti and Ajai Jain},
year = {1996},
doi = {10.1109/ICVD.1996.489480},
url = {http://doi.ieeecomputersociety.org/10.1109/ICVD.1996.489480},
tags = {testing},
researchr = {https://researchr.org/publication/ChakrabartiJ96},
cites = {0},
citedby = {0},
pages = {174-177},
booktitle = {9th International Conference on VLSI Design (VLSI Design 1996), 3-6 January 1996, Bangalore, India},
publisher = {IEEE Computer Society},
}