The hype, myths, and realities of testing 2.5D/3D integrated circuits

Krishnendu Chakrabarty. The hype, myths, and realities of testing 2.5D/3D integrated circuits. In 17th Latin-American Test Symposium, LATS 2016, Foz do Iguacu, Brazil, April 6-8, 2016. pages 1, IEEE, 2016. [doi]

Authors

Krishnendu Chakrabarty

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