Krishnendu Chakrabarty. The hype, myths, and realities of testing 2.5D/3D integrated circuits. In 17th Latin-American Test Symposium, LATS 2016, Foz do Iguacu, Brazil, April 6-8, 2016. pages 1, IEEE, 2016. [doi]
@inproceedings{Chakrabarty16,
title = {The hype, myths, and realities of testing 2.5D/3D integrated circuits},
author = {Krishnendu Chakrabarty},
year = {2016},
doi = {10.1109/LATW.2016.7483326},
url = {http://dx.doi.org/10.1109/LATW.2016.7483326},
researchr = {https://researchr.org/publication/Chakrabarty16},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {17th Latin-American Test Symposium, LATS 2016, Foz do Iguacu, Brazil, April 6-8, 2016},
publisher = {IEEE},
isbn = {978-1-5090-1331-9},
}