Test and Design-for-Testability Solutions for 3D Integrated Circuits

Krishnendu Chakrabarty, Mukesh Agrawal, Sergej Deutsch, Brandon Noia, Ran Wang, Fangming Ye. Test and Design-for-Testability Solutions for 3D Integrated Circuits. IPSJ T. on System LSI Design Methodology, 7:56-73, 2014. [doi]

Abstract

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