Aliasing-free error detection (ALFRED)

Krishnendu Chakrabarty, John P. Hayes. Aliasing-free error detection (ALFRED). In 11th IEEE VLSI Test Symposium (VTS'93), 6 Apr 1993-8 Apr 1993, Atlantic City, NJ, USA. pages 260-266, IEEE, 1993. [doi]

Abstract

Abstract is missing.